| 个人简介 | |
|---|---|
 Dr. Dae Wook Kim University of Arizona,USA |
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| 标题： Electrically-modulated optoelectronics-based infrared sourceenabling ground surface precision deflectometry | |
| 摘要： We introduce the design of a scalable, modulated long-wave infrared source. The design makes use of a pseudo-blackbody heating element array, which radiates into a custom aluminum integrating cavity. The elements possess low thermal capacitance, enabling temporal modulation for improved signal isolation and dynamic background removal. To characterize performance, deflectometry measurements were made using both the new source design and a traditional tungsten ribbon source, which possess similar source irradiance and identical emission profile dimensions. Measurements from a ground glass flat and an aluminum blank demonstrated the new source produces a signal-to-noise ratio four times greater than that of the ribbon. Thermal imaging demonstrated improved source geometry and signal stability over time, and further, the new design measured a previously untestable hot aluminum flat (150 °C). The new design enables high-contrast thermal measurement of surfaces typically challenging to infrared deflectometry due to high surface roughnessor intrinsic thermal noise generation. | |
| 简介：
Dae Wook Kim is an assistant professor of optical sciences and astronomy at the University of Arizona. He has been working in the optical engineering field for more than 10 years, mainly focusing on very large astronomical optics, such as the 25 m diameter Giant Magellan Telescope primary mirrors. His main research area covers precision freeform optics fabrication and various metrology topics, such as interferometric test systems using computer generated holograms, direct curvature measurements, and dynamic deflectometry systems. He is currently a chair of the Optical Manufacturing and Testing conference (SPIE), Optical Fabrication and Testing conference (OSA), and Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems conference (SPIE). He is a senior member of OSA and SPIE and has been serving as an associate editor for the journal Optics Express.
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